Issue Date | Title | Involved Person(s) |
20-Apr-2021 | Comprehensive model for CGO based anodes | Marmet, Philip; Holzer, Lorenz; Grolig, Jan G.; Mai, Andreas; Brader, Joseph M.; Hocker, Thomas |
2001 | Adsorption-energy distribution of heterogeneous surfaces predicted by projections onto convex sets | Hocker, Thomas; Aranovich, Grigoriy L.; Donohue, Marc D. |
15-Dec-2023 | Multiscale-multiphysics model for novel ceramic solid oxide fuel cell electrodes | Marmet, Philip; Holzer, Lorenz; Hocker, Thomas; Boiger, Gernot Kurt |
15-Jan-2015 | Influence of strontium-rich pore-filling phase on the performance of La0.6Sr0.4CoO3−δ thin-film cathodes | Pecho, Omar; Holzer, Lorenz; Yáng, Zhèn; Martynczuk, Julia; Hocker, Thomas; Flatt, Robert J.; Prestat, Michel |
1-Mar-1999 | Monolayer adsorption for the subcritical lattice gas and partially miscible binary mixtures | Hocker, Thomas; Aranovich, G. L.; Donohue, M. D. |
26-Aug-2015 | 3D microstructure effects in Ni-YSZ anodes : prediction of effective transport properties and optimization of redox stability | Pecho, Omar M.; Stenzel, Ole; Iwanschitz, Boris; Gasser, Philippe; Neumann, Matthias; Schmidt, Volker; Prestat, Michel; Hocker, Thomas; Flatt, Robert J.; Holzer, Lorenz |
2011 | Automated, model-based analysis of Uj-data for electrolyte-supported SOFC short-stacks | Linder, Markus; Hocker, Thomas; Denzler, Roland; Mai, Andreas; Iwanschitz, Boris |
2015 | 3D microstructure effects in Ni-YSZ anodes : influence of TPB lengths on the electrochemical performance | Pecho, Omar M.; Mai, Andreas; Münch, Beat; Hocker, Thomas; Flatt, Robert J.; Holzer, Lorenz |
2015 | Ohmic resistance of nickel infiltrated chromium oxide scales in solid oxide fuel cell metallic interconnects | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Pecho, Omar; Friedrich, Andreas; Morawietz, Thomas; Hiesgen, Renate; Kontic, Roman; Iwanschitz, Boris; Mai, Andreas; Schuler, Andreas |
2014 | Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, J. Andreas |