| Issue Date | Title | Involved Person(s) |
| 17-Mar-2023 | Characterization-app : standardized microstructure characterization of SOC electrodes as a key element for Digital Materials Design | Marmet, Philip; Holzer, Lorenz; Hocker, Thomas; Boiger, Gernot K.; Bausinger, Holger, et al |
| 20-Apr-2021 | Comprehensive model for CGO based anodes | Marmet, Philip; Holzer, Lorenz; Grolig, Jan G.; Mai, Andreas; Brader, Joseph M., et al |
| 15-Aug-2015 | A model-based approach for current voltage analyses to quantify degradation and fuel distribution in solid oxide fuel cell stacks | Linder, Markus; Hocker, Thomas; Meier, Christoph; Holzer, Lorenz; Friedrich, Andreas, et al |
| 2015 | Ohmic resistance of nickel infiltrated chromium oxide scales in solid oxide fuel cell metallic interconnects | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Pecho, Omar; Friedrich, Andreas, et al |
| 2014 | Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris, et al |
| 1-Dec-2013 | Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris, et al |
| 1-Feb-2011 | Microstructure degradation of cermet anodes for solid oxide fuel cells : quantification of nickel grain growth in dry and in humid atmospheres | Holzer, Lorenz; Iwanschitz, Boris; Hocker, Thomas; Münch, Beat; Prestat, Michel, et al |
