Clustering phenomena in coupled chaotic circuits with different coupling strength

Uwate, Yoko; Ott, Thomas; Nishio, Yoshifumi

doi:10.1109/ECCTD.2013.6662220

Publication type:	Conference paper
Type of review:	Peer review (publication)
Title:	Clustering phenomena in coupled chaotic circuits with different coupling strength
Authors:	Uwate, Yoko Ott, Thomas Nishio, Yoshifumi
DOI:	10.1109/ECCTD.2013.6662220
Conference details:	European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013
Issue Date:	2013
ISBN:	978-3-00-043785-4
Language:	English
Subjects:	Chaotic; Circuit; Clustering
Subject (DDC):	003: Systems
URI:	http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6662220 https://digitalcollection.zhaw.ch/handle/11475/4413
Fulltext version:	Published version
License (according to publishing contract):	Licence according to publishing contract
Departement:	Life Sciences and Facility Management
Organisational Unit:	Institute of Computational Life Sciences (ICLS)
Appears in collections:	Publikationen Life Sciences und Facility Management

Files in This Item:

There are no files associated with this item.

Show full item record

Uwate, Y., Ott, T., & Nishio, Y. (2013). Clustering phenomena in coupled chaotic circuits with different coupling strength. European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013. https://doi.org/10.1109/ECCTD.2013.6662220

Uwate, Y., Ott, T. and Nishio, Y. (2013) ‘Clustering phenomena in coupled chaotic circuits with different coupling strength’, in European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013. Available at: https://doi.org/10.1109/ECCTD.2013.6662220.

Y. Uwate, T. Ott, and Y. Nishio, “Clustering phenomena in coupled chaotic circuits with different coupling strength,” in European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013, 2013. doi: 10.1109/ECCTD.2013.6662220.

UWATE, Yoko, Thomas OTT und Yoshifumi NISHIO, 2013. Clustering phenomena in coupled chaotic circuits with different coupling strength. In: European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013 [online]. Conference paper. 2013. ISBN 978-3-00-043785-4. Verfügbar unter: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6662220

Uwate, Yoko, Thomas Ott, and Yoshifumi Nishio. 2013. “Clustering Phenomena in Coupled Chaotic Circuits with Different Coupling Strength.” Conference paper. In European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013. https://doi.org/10.1109/ECCTD.2013.6662220.

Uwate, Yoko, et al. “Clustering Phenomena in Coupled Chaotic Circuits with Different Coupling Strength.” European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013, 2013, https://doi.org/10.1109/ECCTD.2013.6662220.