Determination of charge transport activation energy and injection barrier in organic semiconductor devices

Züfle, Simon; Altazin, Stéphane; Hofmann, Alexander; Jäger, Lars; Neukom, Martin T.; Brütting, Wolfgang; Ruhstaller, Beat

doi:10.1063/1.4992041

Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-2764

Full metadata record

DC Field	Value	Language
dc.contributor.author	Züfle, Simon	-
dc.contributor.author	Altazin, Stéphane	-
dc.contributor.author	Hofmann, Alexander	-
dc.contributor.author	Jäger, Lars	-
dc.contributor.author	Neukom, Martin T.	-
dc.contributor.author	Brütting, Wolfgang	-
dc.contributor.author	Ruhstaller, Beat	-
dc.date.accessioned	2018-02-14T08:04:53Z	-
dc.date.available	2018-02-14T08:04:53Z	-
dc.date.issued	2017-09	-
dc.identifier.issn	0021-8979	de_CH
dc.identifier.issn	1089-7550	de_CH
dc.identifier.uri	https://digitalcollection.zhaw.ch/handle/11475/2764	-
dc.language.iso	en	de_CH
dc.publisher	American Institute of Physics	de_CH
dc.relation.ispartof	Journal of Applied Physics	de_CH
dc.rights	http://creativecommons.org/licenses/by/4.0/	de_CH
dc.subject.ddc	621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik	de_CH
dc.title	Determination of charge transport activation energy and injection barrier in organic semiconductor devices	de_CH
dc.type	Beitrag in wissenschaftlicher Zeitschrift	de_CH
dcterms.type	Text	de_CH
zhaw.departement	School of Engineering	de_CH
zhaw.organisationalunit	Institute of Computational Physics (ICP)	de_CH
dc.identifier.doi	10.1063/1.4992041	de_CH
dc.identifier.doi	10.21256/zhaw-2764	-
zhaw.funding.eu	No	de_CH
zhaw.issue	115502	de_CH
zhaw.originated.zhaw	Yes	de_CH
zhaw.publication.status	publishedVersion	de_CH
zhaw.volume	122	de_CH
zhaw.publication.review	Peer review (Publikation)	de_CH
zhaw.funding.snf	151563	de_CH
Appears in collections:	Publikationen School of Engineering

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Züfle, S., Altazin, S., Hofmann, A., Jäger, L., Neukom, M. T., Brütting, W., & Ruhstaller, B. (2017). Determination of charge transport activation energy and injection barrier in organic semiconductor devices. Journal of Applied Physics, 122(115502). https://doi.org/10.1063/1.4992041

Züfle, S. et al. (2017) ‘Determination of charge transport activation energy and injection barrier in organic semiconductor devices’, Journal of Applied Physics, 122(115502). Available at: https://doi.org/10.1063/1.4992041.

S. Züfle et al., “Determination of charge transport activation energy and injection barrier in organic semiconductor devices,” Journal of Applied Physics, vol. 122, no. 115502, Sep. 2017, doi: 10.1063/1.4992041.

ZÜFLE, Simon, Stéphane ALTAZIN, Alexander HOFMANN, Lars JÄGER, Martin T. NEUKOM, Wolfgang BRÜTTING und Beat RUHSTALLER, 2017. Determination of charge transport activation energy and injection barrier in organic semiconductor devices. Journal of Applied Physics. September 2017. Bd. 122, Nr. 115502. DOI 10.1063/1.4992041

Züfle, Simon, Stéphane Altazin, Alexander Hofmann, Lars Jäger, Martin T. Neukom, Wolfgang Brütting, and Beat Ruhstaller. 2017. “Determination of Charge Transport Activation Energy and Injection Barrier in Organic Semiconductor Devices.” Journal of Applied Physics 122 (115502). https://doi.org/10.1063/1.4992041.

Züfle, Simon, et al. “Determination of Charge Transport Activation Energy and Injection Barrier in Organic Semiconductor Devices.” Journal of Applied Physics, vol. 122, no. 115502, Sept. 2017, https://doi.org/10.1063/1.4992041.