Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-27639
Publication type: Conference paper
Type of review: Peer review (abstract)
Title: Development of cost-effective automated test system for determining lifetime of gold contacts under mechanical load
Authors: Alaboz, Hakan
Kovacs, Andras
Safa, Yasser
Mescheder, Ulrich
et. al: No
DOI: 10.21256/zhaw-27639
Proceedings: MikroSystemTechnik Kongress 2021 : Mikroelektronik / Mikrosystemtechnik und ihre Anwendungen Innovative Produkte für zukunftsfähige Märkte
Page(s): 738
Pages to: 741
Conference details: MikroSystemTechnik Kongress, Ludwigsburg, Deutschland, 8.-10. November 2021
Issue Date: 1-Feb-2022
Publisher / Ed. Institution: VDE
Publisher / Ed. Institution: Berlin
ISBN: 978-3-8007-5656-8
Language: English
Subjects: Abnutzung; Goldkontakt; Stresstest
Subject (DDC): 620.11: Engineering materials
Abstract: Mechanic load tests for electrical contacts for different components have been performed and related standards have been developed for various use cases. Even though the readily available literature and standards, conditions of the testing of various components under mechanical loading remain similar. Real life operating conditions usually different then the testing conditions and even the slight difference can influence the precision of the prediction mechanisms. We propose an automated mechanical loading system to mimic real life operating condition and test lifetime of the contact parts. A cost effective, compact experimental test system was designed, produced and tested for stability issues. The automated test system successfully completed one million mechanical loading cycles on the samples and surface deformations as well as lifetime of some contact components were determined. A correlation has been found between computational model and the experimental results.
URI: https://digitalcollection.zhaw.ch/handle/11475/27639
Fulltext version: Accepted version
License (according to publishing contract): Not specified
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Published as part of the ZHAW project: Design-Spaces zur Entwicklung von Sensor- und Aktorsystemen sowie Komponenten mit erhöhter Robustheit bezüglich Herstellung und Lebensdauer
Appears in collections:Publikationen School of Engineering

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Alaboz, H., Kovacs, A., Safa, Y., & Mescheder, U. (2022). Development of cost-effective automated test system for determining lifetime of gold contacts under mechanical load [Conference paper]. MikroSystemTechnik Kongress 2021 : Mikroelektronik / Mikrosystemtechnik Und Ihre Anwendungen Innovative Produkte Für Zukunftsfähige Märkte, 738–741. https://doi.org/10.21256/zhaw-27639
Alaboz, H. et al. (2022) ‘Development of cost-effective automated test system for determining lifetime of gold contacts under mechanical load’, in MikroSystemTechnik Kongress 2021 : Mikroelektronik / Mikrosystemtechnik und ihre Anwendungen Innovative Produkte für zukunftsfähige Märkte. Berlin: VDE, pp. 738–741. Available at: https://doi.org/10.21256/zhaw-27639.
H. Alaboz, A. Kovacs, Y. Safa, and U. Mescheder, “Development of cost-effective automated test system for determining lifetime of gold contacts under mechanical load,” in MikroSystemTechnik Kongress 2021 : Mikroelektronik / Mikrosystemtechnik und ihre Anwendungen Innovative Produkte für zukunftsfähige Märkte, Feb. 2022, pp. 738–741. doi: 10.21256/zhaw-27639.
ALABOZ, Hakan, Andras KOVACS, Yasser SAFA und Ulrich MESCHEDER, 2022. Development of cost-effective automated test system for determining lifetime of gold contacts under mechanical load. In: MikroSystemTechnik Kongress 2021 : Mikroelektronik / Mikrosystemtechnik und ihre Anwendungen Innovative Produkte für zukunftsfähige Märkte. Conference paper. Berlin: VDE. 1 Februar 2022. S. 738–741. ISBN 978-3-8007-5656-8
Alaboz, Hakan, Andras Kovacs, Yasser Safa, and Ulrich Mescheder. 2022. “Development of Cost-Effective Automated Test System for Determining Lifetime of Gold Contacts under Mechanical Load.” Conference paper. In MikroSystemTechnik Kongress 2021 : Mikroelektronik / Mikrosystemtechnik Und Ihre Anwendungen Innovative Produkte Für Zukunftsfähige Märkte, 738–41. Berlin: VDE. https://doi.org/10.21256/zhaw-27639.
Alaboz, Hakan, et al. “Development of Cost-Effective Automated Test System for Determining Lifetime of Gold Contacts under Mechanical Load.” MikroSystemTechnik Kongress 2021 : Mikroelektronik / Mikrosystemtechnik Und Ihre Anwendungen Innovative Produkte Für Zukunftsfähige Märkte, VDE, 2022, pp. 738–41, https://doi.org/10.21256/zhaw-27639.


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