| Publication type: | Book part |
| Type of review: | Editorial review |
| Title: | Review of FIB tomography |
| Authors: | Holzer, Lorenz Cantoni, Marco |
| Published in: | Nanofabrication using focused ion and electron beams : principles and applications |
| Editors of the parent work: | Utke, Ivo Moshkalev, Stanislav Russel, Philip E. |
| Page(s): | 410 |
| Pages to: | 435 |
| Issue Date: | 2012 |
| Series: | Oxford series in nanomanufacturing |
| Publisher / Ed. Institution: | Oxford University Press |
| Publisher / Ed. Institution: | New York |
| ISBN: | 978-0-19-973421-4 |
| Language: | English |
| Subjects: | Map |
| Subject (DDC): | 620.11: Engineering materials |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/2203 |
| Fulltext version: | Published version |
| License (according to publishing contract): | Licence according to publishing contract |
| Departement: | School of Engineering |
| Organisational Unit: | Institute of Computational Physics (ICP) |
| Appears in collections: | Publikationen School of Engineering |
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Holzer, L., & Cantoni, M. (2012). Review of FIB tomography. In I. Utke, S. Moshkalev, & P. E. Russel (Eds.), Nanofabrication using focused ion and electron beams : principles and applications (pp. 410–435). Oxford University Press.
Holzer, L. and Cantoni, M. (2012) ‘Review of FIB tomography’, in I. Utke, S. Moshkalev, and P.E. Russel (eds) Nanofabrication using focused ion and electron beams : principles and applications. New York: Oxford University Press, pp. 410–435.
L. Holzer and M. Cantoni, “Review of FIB tomography,” in Nanofabrication using focused ion and electron beams : principles and applications, I. Utke, S. Moshkalev, and P. E. Russel, Eds. New York: Oxford University Press, 2012, pp. 410–435.
HOLZER, Lorenz und Marco CANTONI, 2012. Review of FIB tomography. In: Ivo UTKE, Stanislav MOSHKALEV und Philip E. RUSSEL (Hrsg.), Nanofabrication using focused ion and electron beams : principles and applications. New York: Oxford University Press. S. 410–435. ISBN 978-0-19-973421-4
Holzer, Lorenz, and Marco Cantoni. 2012. “Review of FIB Tomography.” In Nanofabrication Using Focused Ion and Electron Beams : Principles and Applications, edited by Ivo Utke, Stanislav Moshkalev, and Philip E. Russel, 410–35. New York: Oxford University Press.
Holzer, Lorenz, and Marco Cantoni. “Review of FIB Tomography.” Nanofabrication Using Focused Ion and Electron Beams : Principles and Applications, edited by Ivo Utke et al., Oxford University Press, 2012, pp. 410–35.
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