| Publication type: | Article in scientific journal |
| Type of review: | Peer review (publication) |
| Title: | Coupled opto-electronic simulation of organic bulk-heterojunction solar cells : parameter extraction and sensitivity analysis |
| Authors: | Häusermann, R. Knapp, Evelyne Moos, M. Reinke, N. A. Flatz, T. Ruhstaller, Beat |
| et. al: | No |
| DOI: | 10.1063/1.3259367 |
| Published in: | Journal of Applied Physics |
| Volume(Issue): | 106 |
| Issue: | 10 |
| Pages: | 104507 |
| Issue Date: | 15-Nov-2009 |
| Publisher / Ed. Institution: | American Institute of Physics |
| ISSN: | 0021-8979 1089-7550 |
| Language: | English |
| Subjects: | Materials science; Physics |
| Subject (DDC): | |
| Abstract: | A general problem arising in computer simulations is the number of material and device parameters, which have to be determined by dedicated experiments and simulation-based parameter extraction. In this study we analyze measurements of the short-circuit current dependence on the active layer thickness and current-voltage curves in poly(3-hexylthiophene):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) based solar cells. We have identified a set of parameter values including dissociation parameters that describe the experimental data. The overall agreement of our model with experiment is good, however a discrepancy in the thickness dependence of the current-voltage curve questions the influence of the electric field in the dissociation process. In addition transient simulations are analyzed which show that a measurement of the turn-off photocurrent can be useful for estimating charge carrier mobilities. |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/19816 |
| Fulltext version: | Published version |
| License (according to publishing contract): | Licence according to publishing contract |
| Departement: | School of Engineering |
| Organisational Unit: | Institute of Computational Physics (ICP) |
| Appears in collections: | Publikationen School of Engineering |
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