Title: Gas measurement system
Inventor : Venturini, Francesca
Bergstroem, Paer
Hertel, Martin
Patent submitter: Mettler-Toledo GmbH
Issue Date: 14-Nov-2018
Language : English
Subject (DDC) : 530: Physics
Abstract: The invention relates to a gas measurement system, comprising a coherent light source which emits a light beam; a detector; a beam path which is formed between the light source and the detector; and a gas cell , which is arranged in the beam path between the light source and the detector, such that the detector receives the light transmitted by the gas cell; wherein the gas cell comprises a porous ceramic; and wherein the gas cell has an optical path length which is a multiple of the actual layer thickness of the gas cell; characterised in that, furthermore, an optical element is arranged in the beam path between the light source and the detector; and that the light beam emitted by the light source is widened and unfocused as the light beam enters the gas cell.
Departement: School of Engineering
Organisational Unit: Institute of Applied Mathematics and Physics (IAMP)
Publication type: Patent
Patentnumber : EP3401666
metadata.zhaw.publication.code: A1
URI: https://worldwide.espacenet.com/patent/search?q=pn%3DEP3401666A1
https://digitalcollection.zhaw.ch/handle/11475/19077
Appears in Collections:Patente School of Engineering

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