Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-18965
Publication type: Article in scientific journal
Type of review: Peer review (publication)
Title: Consistent device simulation model describing perovskite solar cells in steady-state, transient, and frequency domain
Authors : Neukom, Martin T.
Schiller, Andreas
Züfle, Simon
Knapp, Evelyne
Ávila, Jorge
Pérez-del-Rey, Daniel
Dreessen, Chris
Zanoni, Kassio P.S.
Sessolo, Michele
Bolink, Henk J.
Ruhstaller, Beat
et. al : No
DOI : 10.1021/acsami.9b04991
10.21256/zhaw-18965
Published in : ACS Applied Materials & Interfaces
Volume(Issue) : 11
Issue : 26
Pages : 23320
Pages to: 23328
Issue Date: 10-Jun-2019
Publisher / Ed. Institution : American Chemical Society
ISSN: 1944-8244
1944-8252
Language : English
Subjects : IMPS; Drift-diffusion modeling; Hysteresis; Impedance spectroscopy; Mobile ions; Perovskite solar cells; Transient photo-current; Traps
Subject (DDC) : 621.3: Electrical engineering and electronics
Abstract: A variety of experiments on vacuum-deposited methylammonium lead iodide perovskite solar cells are presented, including JV curves with different scan rates, light intensity-dependent open-circuit voltage, impedance spectra, intensity-modulated photocurrent spectra, transient photocurrents, and transient voltage step responses. All these experimental data sets are successfully reproduced by a charge drift-diffusion simulation model incorporating mobile ions and charge traps using a single set of parameters. While previous modeling studies focused on a single experimental technique, we combine steady-state, transient, and frequency-domain simulations and measurements. Our study is an important step toward quantitative simulation of perovskite solar cells, leading to a deeper understanding of the physical effects in these materials. The analysis of the transient current upon voltage turn-on in the dark reveals that the charge injection properties of the interfaces are triggered by the accumulation of mobile ionic defects. We show that the current rise of voltage step experiments allow for conclusions about the recombination at the interface. Whether one or two mobile ionic species are used in the model has only a minor influence on the observed effects. A delayed current rise observed upon reversing the bias from +3 to -3 V in the dark cannot be reproduced yet by our drift-diffusion model. We speculate that a reversible chemical reaction of mobile ions with the contact material may be the cause of this effect, thus requiring a future model extension. A parameter variation is performed in order to understand the performance-limiting factors of the device under investigation.
Further description : ​This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Applied Materials & Interfaces, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://pubs.acs.org/doi/10.1021/acsami.9b04991
URI: https://digitalcollection.zhaw.ch/handle/11475/18965
Fulltext version : Accepted version
License (according to publishing contract) : Licence according to publishing contract
Restricted until : 2020-06-11
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Published as part of the ZHAW project : PV2050: Simulation and Characterization
Appears in Collections:Publikationen School of Engineering

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Neukom_ACSApplMaterInt xx,xxx 2019_Supp.pdf
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PSC_Sim_proof.pdf
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Revised Manuscript980.08 kBAdobe PDFView/Open


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