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  2. School of Engineering
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dc.contributor.otherMonnier, Christophe-
dc.contributor.otherBonmarin, Mathias-
dc.contributor.otherCrippa, Federica-
dc.contributor.otherFink, Alke-
dc.contributor.otherGeers, Christoph-
dc.date.accessioned2019-08-26T15:11:15Z-
dc.date.available2019-08-26T15:11:15Z-
dc.date.issued2019-05-23-
dc.date.submitted2017-05-02-
dc.identifier.urihttps://worldwide.espacenet.com/patent/search?q=pn%3DUS2019154602A1de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/17976-
dc.description.abstractA sample holder for magnetic nanoparticle samples including a plurality of sample wells for holding a magnetic nanoparticle sample, which are distributed on a top surface of the sample holder. The sample wells are distributed such that a first distance between neighboring samples wells and/or a second distance between each peripheral sample well and a respective edge of the top surface of the sample holder and/or a third distance between a deepest point of the sample wells and a bottom of the sample holder is between 1 and 100 times greater than a thermal diffusion length of the sample holder material. The sample holder is used in a lock-in thermography system.de_CH
dc.description.sponsorshipAdolphe Merkle Institute, University of Fribourgde_CH
dc.language.isoende_CH
dc.titleSample holder and lock-in thermography system with suchde_CH
dc.title.alternativeProbenhalter und Lock-in-Thermografiesystemde_CH
dc.title.alternativePorte-échantillon et système de thermographie à verrouillagede_CH
dc.typePatentde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawYesde_CH
zhaw.webfeedSensors and Measuring Systemsde_CH
zhaw.id.patentUS2019154602de_CH
zhaw.publication.codeA1de_CH
zhaw.display.portraitYesde_CH
zhaw.relation.patentCA3022092A1de_CH
zhaw.relation.patentEP3452815A1de_CH
zhaw.relation.patentUS10690607B2de_CH
zhaw.relation.patentWO2017191129A1de_CH
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Monnier, C., Bonmarin, M., Crippa, F., Fink, A., & Geers, C. (2019). Sample holder and lock-in thermography system with such (Patent No. US2019154602A1). https://worldwide.espacenet.com/patent/search?q=pn%3DUS2019154602A1
Monnier, C. et al. (2019) ‘Sample holder and lock-in thermography system with such’. Available at: https://worldwide.espacenet.com/patent/search?q=pn%3DUS2019154602A1.
C. Monnier, M. Bonmarin, F. Crippa, A. Fink, and C. Geers, “Sample holder and lock-in thermography system with such,” US2019154602A1, May 23, 2019 [Online]. Available: https://worldwide.espacenet.com/patent/search?q=pn%3DUS2019154602A1
MONNIER, Christophe, Mathias BONMARIN, Federica CRIPPA, Alke FINK und Christoph GEERS, 2019. Sample holder and lock-in thermography system with such [online]. US2019154602A1. 23 Mai 2019. Verfügbar unter: https://worldwide.espacenet.com/patent/search?q=pn%3DUS2019154602A1
Monnier, Christophe, Mathias Bonmarin, Federica Crippa, Alke Fink, and Christoph Geers. 2019. Sample holder and lock-in thermography system with such. US2019154602A1, filed May 2, 2017, and issued May 23, 2019. https://worldwide.espacenet.com/patent/search?q=pn%3DUS2019154602A1.
Monnier, Christophe, et al. Sample Holder and Lock-in Thermography System with Such. US2019154602A1, 23 May 2019, https://worldwide.espacenet.com/patent/search?q=pn%3DUS2019154602A1.


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