| Publication type: | Patent |
| Title: | Method and device for characterizing the linear properties of an electrical component |
| Inventor: | Niayesh, Kaveh Berth, Matthias Dahlquist, Andreas Tiberg, Martin Heitz, Christoph |
| Patent submitter: | ABB Research Ltd |
| Registration date: | 21-Jan-2005 |
| Issue Date: | 14-Jun-2017 |
| Publication number: | EP1684081 |
| metadata.zhaw.publication.code: | B1 |
| Published as: | BRPI0606482A2; CA2601321A1; CA2601321C; CN101107533A; CN101107533B; ES2638765T3; NO20074246L; RU2007131587A; RU2383027C2; US2007285109A1; US8154311B2; WO2006076824A1 |
| Language: | English |
| Subject (DDC): | 621.3: Electrical, communications, control engineering |
| Abstract: | The invention relates to a method and a device for characterizing the linear properties of an electrical multiport component. It also relates to a method for modeling an electrical system with at least one component characterized in this manner. |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/17030 https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1 |
| Departement: | School of Engineering |
| Organisational Unit: | Institute of Data Analysis and Process Design (IDP) |
| Appears in collections: | Patente School of Engineering |
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Niayesh, K., Berth, M., Dahlquist, A., Tiberg, M., & Heitz, C. (2017). Method and device for characterizing the linear properties of an electrical component (Patent No. EP1684081B1). https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
Niayesh, K. et al. (2017) ‘Method and device for characterizing the linear properties of an electrical component’. Available at: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.
K. Niayesh, M. Berth, A. Dahlquist, M. Tiberg, and C. Heitz, “Method and device for characterizing the linear properties of an electrical component,” EP1684081B1, Jun. 14, 2017 [Online]. Available: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
NIAYESH, Kaveh, Matthias BERTH, Andreas DAHLQUIST, Martin TIBERG und Christoph HEITZ, 2017. Method and device for characterizing the linear properties of an electrical component [online]. EP1684081B1. 14 Juni 2017. Verfügbar unter: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
Niayesh, Kaveh, Matthias Berth, Andreas Dahlquist, Martin Tiberg, and Christoph Heitz. 2017. Method and device for characterizing the linear properties of an electrical component. EP1684081B1, filed January 21, 2005, and issued June 14, 2017. https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.
Niayesh, Kaveh, et al. Method and Device for Characterizing the Linear Properties of an Electrical Component. EP1684081B1, 14 June 2017, https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.
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