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dc.contributor.authorLinder, Markus-
dc.contributor.authorHocker, Thomas-
dc.contributor.authorHolzer, Lorenz-
dc.contributor.authorFriedrich, K. Andreas-
dc.contributor.authorIwanschitz, Boris-
dc.contributor.authorMai, Andreas-
dc.contributor.authorSchuler, J. Andreas-
dc.date.accessioned2017-11-30T15:26:19Z-
dc.date.available2017-11-30T15:26:19Z-
dc.date.issued2013-12-01-
dc.identifier.issn0378-7753de_CH
dc.identifier.issn1873-2755de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/1648-
dc.description.abstractThe ohmic resistance caused by Cr2O3 scale formation on metallic interconnects (MICs) can significantly contribute to the overall degradation of SOFC stacks. For this reason oxide scale growth on Cr5Fe1Y2O3 (CFY) and Fe22Cr0.5Mn (Crofer) was investigated by scanning electron microscopy (SEM) from post-test samples that were either exposed to air at 850°C (furnace) or operated in Hexis planar SOFC-stacks under dual atmospheres (anode and cathode conditions) at temperatures around 900°C. The study includes unique test results from a stack operated for 40,000 h. To analyze inhomogeneity in scale thicknesses a dedicated statistical image analysis method has been applied. SEM images were used to compare the structural phenomena related to MIC oxidation at different sample locations. The observed differences between different sample locations may relate to locally different conditions (temperature, pO2, H2O/O2-ratio). Cr2O3 scale growth on the anode side is found to be approximately twice as fast in comparison to the scale growth on cathode side. Finally, based on our time lapse analyses with extensive sampling it can be concluded that reliable predictions of scale growth requires statistical analyses over a period that covers at least a quarter (10,000 h) of the required SOFC stack lifetime (40,000 h).de_CH
dc.language.isoende_CH
dc.publisherElsevierde_CH
dc.relation.ispartofJournal of Power Sourcesde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectChromium oxidede_CH
dc.subjectScale growth rate lawde_CH
dc.subjectInterconnectde_CH
dc.subjectSOFCde_CH
dc.subject.ddc530: Physikde_CH
dc.subject.ddc621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnikde_CH
dc.titleCr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operationde_CH
dc.typeBeitrag in wissenschaftlicher Zeitschriftde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
dc.identifier.doi10.1016/j.jpowsour.2013.05.200de_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end518de_CH
zhaw.pages.start508de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume243de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
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Linder, M., Hocker, T., Holzer, L., Friedrich, K. A., Iwanschitz, B., Mai, A., & Schuler, J. A. (2013). Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation. Journal of Power Sources, 243, 508–518. https://doi.org/10.1016/j.jpowsour.2013.05.200
Linder, M. et al. (2013) ‘Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation’, Journal of Power Sources, 243, pp. 508–518. Available at: https://doi.org/10.1016/j.jpowsour.2013.05.200.
M. Linder et al., “Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation,” Journal of Power Sources, vol. 243, pp. 508–518, Dec. 2013, doi: 10.1016/j.jpowsour.2013.05.200.
LINDER, Markus, Thomas HOCKER, Lorenz HOLZER, K. Andreas FRIEDRICH, Boris IWANSCHITZ, Andreas MAI und J. Andreas SCHULER, 2013. Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation. Journal of Power Sources. 1 Dezember 2013. Bd. 243, S. 508–518. DOI 10.1016/j.jpowsour.2013.05.200
Linder, Markus, Thomas Hocker, Lorenz Holzer, K. Andreas Friedrich, Boris Iwanschitz, Andreas Mai, and J. Andreas Schuler. 2013. “Cr2O3 Scale Growth Rates on Metallic Interconnectors Derived from 40,000 H Solid Oxide Fuel Cell Stack Operation.” Journal of Power Sources 243 (December): 508–18. https://doi.org/10.1016/j.jpowsour.2013.05.200.
Linder, Markus, et al. “Cr2O3 Scale Growth Rates on Metallic Interconnectors Derived from 40,000 H Solid Oxide Fuel Cell Stack Operation.” Journal of Power Sources, vol. 243, Dec. 2013, pp. 508–18, https://doi.org/10.1016/j.jpowsour.2013.05.200.


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