|Title:||Residual stress and buckling patterns of yttria-stabilised-zirconia thin films for micro-solid oxide fuel cell membranes|
|Authors :||Evans, Anna|
Gauckler, Ludwig J.
De Rooij, Nico
|Proceedings:||Ionic and mixed conducting ceramics|
|Conference details:||221st ECS Meeting, Seattle, Washington, 6–10 May 2012|
|Editors of the parent work:||Mogensen, M. B.|
Gür, T. M.
|Publisher / Ed. Institution :||The Electrochemical Society|
|Publisher / Ed. Institution:||Pennington, N. J.|
|License (according to publishing contract) :||Licence according to publishing contract|
|Series :||ECS Transactions|
|Series volume:||45, 1|
|Type of review:||Not specified|
|Subject (DDC) :||621.3: Electrical engineering and electronics |
660: Chemical engineering
|Abstract:||Free-standing yttria-stabilised-zirconia (YSZ) thin films can be found in today's miniaturised gas sensors and as electrolytes in micro-solid oxide fuel cell membranes. 8 mol.% YSZ thin films prepared by pulsed laser deposition on silicon substrates are investigated by wafer curvature and nanoindentation. The 300nm thin 8YSZ films deposited at 700°C have a compressive stress of -1100±150 MPa and a Young's modulus of 205±20 GPa at 25 °C. The corresponding free-standing 8YSZ membranes are investigated by light microscopy and white light interferometry. The 8YSZ membranes deposited at 700°C have a buckling shape with a C4z-rotational symmetry and buckling amplitude of 6.5μm at 25°C. Numerical simulations of the buckling patterns using the Rayleigh-Ritz-method are in good agreement with the experimental data. These simulated buckling patterns are used to extract the local stress distribution. This is important regarding the application of YSZ membranes in micro-solid oxide fuel cells which must be thermomechanically-stable during device operation.|
|Departement:||School of Engineering|
|Organisational Unit:||Institute of Computational Physics (ICP)|
|Publication type:||Conference Paper|
|Appears in Collections:||Publikationen School of Engineering|
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.