Title: Residual stress and buckling patterns of yttria-stabilised-zirconia thin films for micro-solid oxide fuel cell membranes
Authors : Evans, Anna
Prestat, Michel
Tölke, René
Gauckler, Ludwig J.
Hocker, Thomas
Safa, Yasser
Briand, Danick
Courbat, Jérôme
De Rooij, Nico
Proceedings: Ionic and mixed conducting ceramics
Volume(Issue) : 8
Pages : 475
Pages to: 479
Conference details: 221st ECS Meeting, Seattle, Washington, 6–10 May 2012
Editors of the parent work: Mogensen, M. B.
Armstrong, T.
Gür, T. M.
Yokokawa, H.
Zhou, X.-D.
Publisher / Ed. Institution : The Electrochemical Society
Publisher / Ed. Institution: Pennington, N. J.
Issue Date: 2012
License (according to publishing contract) : Licence according to publishing contract
Series : ECS Transactions
Series volume: 45, 1
Type of review: Not specified
Language : English
Subject (DDC) : 621.3: Electrical engineering and electronics
660: Chemical engineering
Abstract: Free-standing yttria-stabilised-zirconia (YSZ) thin films can be found in today's miniaturised gas sensors and as electrolytes in micro-solid oxide fuel cell membranes. 8 mol.% YSZ thin films prepared by pulsed laser deposition on silicon substrates are investigated by wafer curvature and nanoindentation. The 300nm thin 8YSZ films deposited at 700°C have a compressive stress of -1100±150 MPa and a Young's modulus of 205±20 GPa at 25 °C. The corresponding free-standing 8YSZ membranes are investigated by light microscopy and white light interferometry. The 8YSZ membranes deposited at 700°C have a buckling shape with a C4z-rotational symmetry and buckling amplitude of 6.5μm at 25°C. Numerical simulations of the buckling patterns using the Rayleigh-Ritz-method are in good agreement with the experimental data. These simulated buckling patterns are used to extract the local stress distribution. This is important regarding the application of YSZ membranes in micro-solid oxide fuel cells which must be thermomechanically-stable during device operation.
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Publication type: Conference Paper
DOI : 10.1149/1.3701338
ISBN: 978-1-56677-953-1
ISSN: 1938-6737
URI: https://digitalcollection.zhaw.ch/handle/11475/1615
Appears in Collections:Publikationen School of Engineering

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