Publikationstyp: Beitrag in wissenschaftlicher Zeitschrift
Art der Begutachtung: Peer review (Publikation)
Titel: Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers
Autor/-in: Fluhr, Daniel
Züfle, Simon
Muhsin, Burhan
Öttking, Rolf
Seeland, Marco
Roesch, Roland
Schubert, Ulrich S.
Ruhstaller, Beat
Krischok, Stefan
Hoppe, Harald
DOI: 10.1002/pssa.201800474
Erschienen in: Physica status solidi A
Band(Heft): 215
Heft: 23
Erscheinungsdatum: 2018
Verlag / Hrsg. Institution: Wiley
ISSN: 1862-6300
1862-6319
0031-8965
Sprache: Deutsch
Fachgebiet (DDC): 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik
Zusammenfassung: Appreciable progress has been achieved in the development of organic photovoltaics (OPV) over the last decade. However, further improvement of operational stability remains a challenge. In this contribution, focus is placed on corrosion and delamination of the metal contact, which are mainly caused by oxygen or water vapor ingress but in other cases also via mechanical wear and different thermal expansion coefficients. So‐called pinholes and electrode edges provide pathways for ingress of water vapor and oxygen, which may attack the metal–organic interface. Thus, electrical insolation via formation of insulating metal oxide and concomitant mechanical delamination occurs. As charge injection and extraction is suppressed at insulated and delaminated areas, the active area contributing to power conversion gets reduced. This work links analytical and numerical predictions about the active area in contact with the electrode to experimentally observe dependencies. Spatially and time‐resolved electroluminescence measurements provide information on location, size, and growth‐rate of insulated areas. Area loss rates for dark spots depend either sub‐linear (for early stages and edge‐ingress) or linear (later stages) on time. The initial defect size has a clear impact on growth rates. Furthermore, it has possible to demonstrate titanium oxide interlayers to slow down this type of extrinsic degradation.
Weitere Angaben: Article 1800474
URI: https://digitalcollection.zhaw.ch/handle/11475/15723
Volltext Version: Publizierte Version
Lizenz (gemäss Verlagsvertrag): Lizenz gemäss Verlagsvertrag
Departement: School of Engineering
Organisationseinheit: Institute of Computational Physics (ICP)
Enthalten in den Sammlungen:Publikationen School of Engineering

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Fluhr, D., Züfle, S., Muhsin, B., Öttking, R., Seeland, M., Roesch, R., Schubert, U. S., Ruhstaller, B., Krischok, S., & Hoppe, H. (2018). Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers. Physica status solidi A, 215(23). https://doi.org/10.1002/pssa.201800474
Fluhr, D. et al. (2018) ‘Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers’, Physica status solidi A, 215(23). Available at: https://doi.org/10.1002/pssa.201800474.
D. Fluhr et al., “Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers,” Physica status solidi A, vol. 215, no. 23, 2018, doi: 10.1002/pssa.201800474.
FLUHR, Daniel, Simon ZÜFLE, Burhan MUHSIN, Rolf ÖTTKING, Marco SEELAND, Roland ROESCH, Ulrich S. SCHUBERT, Beat RUHSTALLER, Stefan KRISCHOK und Harald HOPPE, 2018. Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers. Physica status solidi A. 2018. Bd. 215, Nr. 23. DOI 10.1002/pssa.201800474
Fluhr, Daniel, Simon Züfle, Burhan Muhsin, Rolf Öttking, Marco Seeland, Roland Roesch, Ulrich S. Schubert, Beat Ruhstaller, Stefan Krischok, and Harald Hoppe. 2018. “Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers.” Physica status solidi A 215 (23). https://doi.org/10.1002/pssa.201800474.
Fluhr, Daniel, et al. “Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers.” Physica status solidi A, vol. 215, no. 23, 2018, https://doi.org/10.1002/pssa.201800474.


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