Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers

Fluhr, Daniel; Züfle, Simon; Muhsin, Burhan; Öttking, Rolf; Seeland, Marco; Roesch, Roland; Schubert, Ulrich S.; Ruhstaller, Beat; Krischok, Stefan; Hoppe, Harald

doi:10.1002/pssa.201800474

Publication type:	Article in scientific journal
Type of review:	Peer review (publication)
Title:	Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers
Authors:	Fluhr, Daniel Züfle, Simon Muhsin, Burhan Öttking, Rolf Seeland, Marco Roesch, Roland Schubert, Ulrich S. Ruhstaller, Beat Krischok, Stefan Hoppe, Harald
DOI:	10.1002/pssa.201800474
Published in:	Physica status solidi A
Volume(Issue):	215
Issue:	23
Issue Date:	2018
Publisher / Ed. Institution:	Wiley
ISSN:	1862-6300 1862-6319 0031-8965
Language:	German
Subject (DDC):
Abstract:	Appreciable progress has been achieved in the development of organic photovoltaics (OPV) over the last decade. However, further improvement of operational stability remains a challenge. In this contribution, focus is placed on corrosion and delamination of the metal contact, which are mainly caused by oxygen or water vapor ingress but in other cases also via mechanical wear and different thermal expansion coefficients. So‐called pinholes and electrode edges provide pathways for ingress of water vapor and oxygen, which may attack the metal–organic interface. Thus, electrical insolation via formation of insulating metal oxide and concomitant mechanical delamination occurs. As charge injection and extraction is suppressed at insulated and delaminated areas, the active area contributing to power conversion gets reduced. This work links analytical and numerical predictions about the active area in contact with the electrode to experimentally observe dependencies. Spatially and time‐resolved electroluminescence measurements provide information on location, size, and growth‐rate of insulated areas. Area loss rates for dark spots depend either sub‐linear (for early stages and edge‐ingress) or linear (later stages) on time. The initial defect size has a clear impact on growth rates. Furthermore, it has possible to demonstrate titanium oxide interlayers to slow down this type of extrinsic degradation.
Further description:	Article 1800474
URI:	https://digitalcollection.zhaw.ch/handle/11475/15723
Fulltext version:	Published version
License (according to publishing contract):	Licence according to publishing contract
Departement:	School of Engineering
Organisational Unit:	Institute of Computational Physics (ICP)
Appears in collections:	Publikationen School of Engineering

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Fluhr, D., Züfle, S., Muhsin, B., Öttking, R., Seeland, M., Roesch, R., Schubert, U. S., Ruhstaller, B., Krischok, S., & Hoppe, H. (2018). Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers. Physica status solidi A, 215(23). https://doi.org/10.1002/pssa.201800474

Fluhr, D. et al. (2018) ‘Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers’, Physica status solidi A, 215(23). Available at: https://doi.org/10.1002/pssa.201800474.

D. Fluhr et al., “Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers,” Physica status solidi A, vol. 215, no. 23, 2018, doi: 10.1002/pssa.201800474.

FLUHR, Daniel, Simon ZÜFLE, Burhan MUHSIN, Rolf ÖTTKING, Marco SEELAND, Roland ROESCH, Ulrich S. SCHUBERT, Beat RUHSTALLER, Stefan KRISCHOK und Harald HOPPE, 2018. Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers. Physica status solidi A. 2018. Bd. 215, Nr. 23. DOI 10.1002/pssa.201800474

Fluhr, Daniel, Simon Züfle, Burhan Muhsin, Rolf Öttking, Marco Seeland, Roland Roesch, Ulrich S. Schubert, Beat Ruhstaller, Stefan Krischok, and Harald Hoppe. 2018. “Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers.” Physica status solidi A 215 (23). https://doi.org/10.1002/pssa.201800474.

Fluhr, Daniel, et al. “Aluminum electrode insulation dynamics via interface oxidation by reactant diffusion in organic layers.” Physica status solidi A, vol. 215, no. 23, 2018, https://doi.org/10.1002/pssa.201800474.