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|Publication type:||Article in scientific journal|
|Type of review:||Peer review (publication)|
|Title:||Thermography : high sensitivity and specificity diagnosing contact dermatitis in patch testing|
|Authors :||Anzengruber, Florian|
Kaufmann, Lilian S.
Oswald, Martin R.
Meier Käppeli, Barbara Katharina
French, Lars E.
Navarini, Alexander A.
|Published in :||Allergology International|
|Publisher / Ed. Institution :||Japanese Society of Allergology|
|Subjects :||Allergic contact dermatitis; Contact allergy; Infrared; Irritant contact dermatitis; Patch testing|
|Subject (DDC) :||616: Internal medicine and diseases|
|Abstract:||Background: Patch testing of contact allergens to diagnose allergic contact dermatitis (ACD) is a traditional, useful tool. The most important decision is the distinction between allergic and irritant reactions, as this has direct implications on diagnosis and management. Our objective was to evaluate a new method of non-contact infrared reading of patch tests. Secondary objectives included a possible correlation between the intensity of the patch test reaction and temperature change. Methods: 420 positive reactions from patients were included in our study. An independent patch test reader assessed the positive reactions and classified them as allergic (of intensity + to +++) or irritant (IR). At the same time, a forward-looking infrared (FLIR) camera attachment for an iPhone was used to acquire infrared thermal images of the patch tests, and images were analyzed using the FLIR ONE app. Results: Allergic patch test reactions were characterized by temperature increases of 0.72 ± 0.67°C compared to surrounding skin. Irritant reactions only resulted in 0.17 ± 0.31 °C temperature increase. The mean temperature difference between the two groups was highly significant (p < 0.0001) and therefore was used to predict the type of contact dermatitis. Conclusions: Thermography is a reliable and effective way to distinguish between allergic and irritant contact dermatitis.|
|Further description :||In Press|
|Fulltext version :||Published version|
|License (according to publishing contract) :||CC BY-NC-ND 4.0: Attribution - Non commercial - No derivatives 4.0 International|
|Departement:||School of Engineering|
|Organisational Unit:||Institute of Computational Physics (ICP)|
|Appears in Collections:||Publikationen School of Engineering|
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