Results 1-15 of 29 (Search time: 0.01 seconds).
Item hits:
Issue DateTitleInvolved Person(s)
May-2000Comparing and Evaluating Pesticide Leaching Models : Results of Simulations with PELMOKlein, M.; Hosang, Jürg; Schäfer, H.; Erzgräber, B.; Resseler, H.
May-2000Smooth stable planes and the moduli spaces of locally compact translation planesBödi, Richard; Immervoll, Stefan; Löwe, Harald
May-2000Stable and unstable formulations of the convection operator in spectral element simulationsWilhelm, Dirk; Kleiser, Leonhard
May-2000Comparing and evaluating pesticide leaching models : results for the Tor Mancina data set (Italy)Francaviglia, R.; Capri, E.; Klein, M.; Hosang, Jürg; Aden, K.; Trevisan, M.; Errera, G.
4-Feb-2000Bias-tuned reduction of self-absorption in polymer blend electroluminescenceRuhstaller, Beat; Scott, J.C.; Brock, P.J.; Scherf, Ullrich; Carter, S.A.
2000Correction of specimen absorption in X-ray diffuse scattering experiments with area-detector systemsScheidegger, Stephan; Estermann, Michael Alexander; Steurer, Steurer
2000Punktsieg für das HartreibenAgarico, Jörg
2000Activated poly(hydromethylsiloxane)s as novel adhesion promoters for metallic surfacesHirayama, Martina; Soares, Marie; Caseri, Walter; Suter, Ulrich; Goussev, Olga
2000Scanning near-field optical microscopy with aperture probes : fundamentals and applicationsHecht, Bert; Sick, Beate; Wild, Urs P.; Deckert, Volker; Zenobi, Renato; Martin, Olivier J. F.; Pohl, Dieter W.
2000Superconducting gap and pseudogap in Bi-2212Opel, M.; Venturini, Francesca; Hackl, R.; Revaz, B.; Berger, H.; Forrò, L.
Jan-2000Nonparametric function estimation of the relationship between two repeatedly measured variablesRuckstuhl, Andreas; Welsh, A.H.; Carroll, R.J.
2000Coatings with siloxane layers in nanoscale thickness : hydrophobization, adhesion promotion, corrosion protectionHirayama, Martina; Caseri, Walter; Suter, Ulrich
2000Collective modes and electronic raman scattering in the cupratesVenturini, F.; Michelucci, U.; Devereaux, T. P.; Kampf, A. P.
2000CGI Project methodologyZimmerli, Frank; Rigley, Vanessa; Senti, Patrik; Gilardi, Simona; Baudinot, Gerold; Stublia, Daniel; Crowther, Adam
2000Implicit characterizations of smooth incidence geometriesBödi, Richard; Immervoll, Stefan
Results 1-15 of 29 (Search time: 0.01 seconds).