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Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-25046
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dc.contributor.authorNoseda, Mario-
dc.contributor.authorFrei, Fabian-
dc.contributor.authorRüst, Andreas-
dc.contributor.authorKünzli, Simon-
dc.date.accessioned2022-05-30T14:23:46Z-
dc.date.available2022-05-30T14:23:46Z-
dc.date.issued2022-06-
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/25046-
dc.description.abstractMemory corruption is still the most used type of exploit in today’s malware landscape. Human error inevitably introduces memory vulnerabilities into software by using memory-unsafe languages like C and C++, affecting not only security but also safety, dependability, and even basic functionality of devices. The Rust language guarantees memory safety without a garbage collector, promises comparable performance to C/C++, and allows for gradual extension of existing codebases by using its foreign function interface. This report presents the risks of having memory vulnerabilities in embedded applications, what a switch to Rust looks like, how the development experiences differ between Rust and C/C++, and if there are significant differences in performance.de_CH
dc.language.isoende_CH
dc.publisherWEKAde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectBare-metal programmingde_CH
dc.subjectCde_CH
dc.subjectCPPde_CH
dc.subjectCybersecurityde_CH
dc.subjectEmbedded systemde_CH
dc.subjectExploitde_CH
dc.subjectIoTde_CH
dc.subjectMemory unsafetyde_CH
dc.subjectRustde_CH
dc.subject.ddc005: Computerprogrammierung, Programme und Datende_CH
dc.titleRust for secure IoT applications : why C is getting rustyde_CH
dc.typeKonferenz: Paperde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Embedded Systems (InES)de_CH
dc.identifier.doi10.21256/zhaw-25046-
zhaw.conference.detailsEmbedded World Conference, Nuremberg, Germany, 21-23 June 2022de_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawYesde_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.publication.reviewPeer review (Abstract)de_CH
zhaw.author.additionalNode_CH
zhaw.display.portraitYesde_CH
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Noseda, M., Frei, F., Rüst, A., & Künzli, S. (2022, June). Rust for secure IoT applications : why C is getting rusty. Embedded World Conference, Nuremberg, Germany, 21-23 June 2022. https://doi.org/10.21256/zhaw-25046
Noseda, M. et al. (2022) ‘Rust for secure IoT applications : why C is getting rusty’, in Embedded World Conference, Nuremberg, Germany, 21-23 June 2022. WEKA. Available at: https://doi.org/10.21256/zhaw-25046.
M. Noseda, F. Frei, A. Rüst, and S. Künzli, “Rust for secure IoT applications : why C is getting rusty,” in Embedded World Conference, Nuremberg, Germany, 21-23 June 2022, Jun. 2022. doi: 10.21256/zhaw-25046.
NOSEDA, Mario, Fabian FREI, Andreas RÜST und Simon KÜNZLI, 2022. Rust for secure IoT applications : why C is getting rusty. In: Embedded World Conference, Nuremberg, Germany, 21-23 June 2022. Conference paper. WEKA. Juni 2022
Noseda, Mario, Fabian Frei, Andreas Rüst, and Simon Künzli. 2022. “Rust for Secure IoT Applications : Why C Is Getting Rusty.” Conference paper. In Embedded World Conference, Nuremberg, Germany, 21-23 June 2022. WEKA. https://doi.org/10.21256/zhaw-25046.
Noseda, Mario, et al. “Rust for Secure IoT Applications : Why C Is Getting Rusty.” Embedded World Conference, Nuremberg, Germany, 21-23 June 2022, WEKA, 2022, https://doi.org/10.21256/zhaw-25046.


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