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Publikationstyp: Beitrag in wissenschaftlicher Zeitschrift
Art der Begutachtung: Peer review (Publikation)
Titel: Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells
Autor/-in: Diethelm, Matthias
Penninck, Lieven
Regnat, Markus
Offermans, Ton
Zimmermann, Birger
Kirsch, Christoph
Hiestand, Roman
Altazin, Stéphane
Ruhstaller, Beat
et. al: No
DOI: 10.1016/j.solener.2020.08.058
10.21256/zhaw-24641
Erschienen in: Solar Energy
Band(Heft): 209
Seite(n): 186
Seiten bis: 193
Erscheinungsdatum: Okt-2020
Verlag / Hrsg. Institution: Elsevier
ISSN: 0038-092X
Sprache: Englisch
Schlagwörter: Photovoltaik; Thermal imaging; Electrothermal simulation; Organic photovoltaics; Finite element method (FEM)
Fachgebiet (DDC): 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik
Zusammenfassung: Sheet resistance losses and local defects are challenges faced in solar module fabrication and upscaling processes. Commonly used investigation tools are non-invasive optical and thermal imaging techniques, such as electroluminescence, photoluminescence as well as illuminated and dark infrared imaging. Here, we investigate the potential of computationally efficient finite element simulation of solar cells and modules by considering planar electrodes coupled by a local current–voltage coupling law. Sheet resistances are determined by fitting current simulation results of an OPV solar cell to electroluminescence imaging data. Moreover, a thermal model is introduced that accounts for Joule heating due to an electrothermal coupling. A direct comparison of simulated temperature maps to measured infrared images is therefore possible. The electrothermal model is successfully validated by comparing measured and simulated temperature profiles across four interconnected organic solar cells of a mini-module. Furthermore, the influence of shunts on the thermal behavior of OPV modules is investigated by comparing electrothermal simulation results to dark lock-In IR thermography images.
URI: https://digitalcollection.zhaw.ch/handle/11475/24641
Volltext Version: Publizierte Version
Lizenz (gemäss Verlagsvertrag): CC BY-NC-ND 4.0: Namensnennung - Nicht kommerziell - Keine Bearbeitungen 4.0 International
Departement: School of Engineering
Organisationseinheit: Institute of Computational Physics (ICP)
Enthalten in den Sammlungen:Publikationen School of Engineering

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Diethelm, M., Penninck, L., Regnat, M., Offermans, T., Zimmermann, B., Kirsch, C., Hiestand, R., Altazin, S., & Ruhstaller, B. (2020). Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells. Solar Energy, 209, 186–193. https://doi.org/10.1016/j.solener.2020.08.058
Diethelm, M. et al. (2020) ‘Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells’, Solar Energy, 209, pp. 186–193. Available at: https://doi.org/10.1016/j.solener.2020.08.058.
M. Diethelm et al., “Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells,” Solar Energy, vol. 209, pp. 186–193, Oct. 2020, doi: 10.1016/j.solener.2020.08.058.
DIETHELM, Matthias, Lieven PENNINCK, Markus REGNAT, Ton OFFERMANS, Birger ZIMMERMANN, Christoph KIRSCH, Roman HIESTAND, Stéphane ALTAZIN und Beat RUHSTALLER, 2020. Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells. Solar Energy. Oktober 2020. Bd. 209, S. 186–193. DOI 10.1016/j.solener.2020.08.058
Diethelm, Matthias, Lieven Penninck, Markus Regnat, Ton Offermans, Birger Zimmermann, Christoph Kirsch, Roman Hiestand, Stéphane Altazin, and Beat Ruhstaller. 2020. “Finite Element Modeling for Analysis of Electroluminescence and Infrared Images of Thin-Film Solar Cells.” Solar Energy 209 (October): 186–93. https://doi.org/10.1016/j.solener.2020.08.058.
Diethelm, Matthias, et al. “Finite Element Modeling for Analysis of Electroluminescence and Infrared Images of Thin-Film Solar Cells.” Solar Energy, vol. 209, Oct. 2020, pp. 186–93, https://doi.org/10.1016/j.solener.2020.08.058.


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