Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation

Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, J. Andreas

doi:10.1016/j.jpowsour.2013.05.200

Publication type:	Article in scientific journal
Type of review:	Peer review (publication)
Title:	Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation
Authors:	Linder, Markus Hocker, Thomas Holzer, Lorenz Friedrich, K. Andreas Iwanschitz, Boris Mai, Andreas Schuler, J. Andreas
DOI:	10.1016/j.jpowsour.2013.05.200
Published in:	Journal of Power Sources
Volume(Issue):	243
Page(s):	508
Pages to:	518
Issue Date:	1-Dec-2013
Publisher / Ed. Institution:	Elsevier
ISSN:	0378-7753 1873-2755
Language:	English
Subjects:	Chromium oxide; Scale growth rate law; Interconnect; SOFC
Subject (DDC):	530: Physics 621.3: Electrical, communications, control engineering
Abstract:	The ohmic resistance caused by Cr2O3 scale formation on metallic interconnects (MICs) can significantly contribute to the overall degradation of SOFC stacks. For this reason oxide scale growth on Cr5Fe1Y2O3 (CFY) and Fe22Cr0.5Mn (Crofer) was investigated by scanning electron microscopy (SEM) from post-test samples that were either exposed to air at 850°C (furnace) or operated in Hexis planar SOFC-stacks under dual atmospheres (anode and cathode conditions) at temperatures around 900°C. The study includes unique test results from a stack operated for 40,000 h. To analyze inhomogeneity in scale thicknesses a dedicated statistical image analysis method has been applied. SEM images were used to compare the structural phenomena related to MIC oxidation at different sample locations. The observed differences between different sample locations may relate to locally different conditions (temperature, pO2, H2O/O2-ratio). Cr2O3 scale growth on the anode side is found to be approximately twice as fast in comparison to the scale growth on cathode side. Finally, based on our time lapse analyses with extensive sampling it can be concluded that reliable predictions of scale growth requires statistical analyses over a period that covers at least a quarter (10,000 h) of the required SOFC stack lifetime (40,000 h).
URI:	https://digitalcollection.zhaw.ch/handle/11475/1648
Fulltext version:	Published version
License (according to publishing contract):	Licence according to publishing contract
Departement:	School of Engineering
Organisational Unit:	Institute of Computational Physics (ICP)
Appears in collections:	Publikationen School of Engineering

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Linder, M., Hocker, T., Holzer, L., Friedrich, K. A., Iwanschitz, B., Mai, A., & Schuler, J. A. (2013). Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation. Journal of Power Sources, 243, 508–518. https://doi.org/10.1016/j.jpowsour.2013.05.200

Linder, M. et al. (2013) ‘Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation’, Journal of Power Sources, 243, pp. 508–518. Available at: https://doi.org/10.1016/j.jpowsour.2013.05.200.

M. Linder et al., “Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation,” Journal of Power Sources, vol. 243, pp. 508–518, Dec. 2013, doi: 10.1016/j.jpowsour.2013.05.200.

LINDER, Markus, Thomas HOCKER, Lorenz HOLZER, K. Andreas FRIEDRICH, Boris IWANSCHITZ, Andreas MAI und J. Andreas SCHULER, 2013. Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation. Journal of Power Sources. 1 Dezember 2013. Bd. 243, S. 508–518. DOI 10.1016/j.jpowsour.2013.05.200

Linder, Markus, Thomas Hocker, Lorenz Holzer, K. Andreas Friedrich, Boris Iwanschitz, Andreas Mai, and J. Andreas Schuler. 2013. “Cr2O3 Scale Growth Rates on Metallic Interconnectors Derived from 40,000 H Solid Oxide Fuel Cell Stack Operation.” Journal of Power Sources 243 (December): 508–18. https://doi.org/10.1016/j.jpowsour.2013.05.200.

Linder, Markus, et al. “Cr2O3 Scale Growth Rates on Metallic Interconnectors Derived from 40,000 H Solid Oxide Fuel Cell Stack Operation.” Journal of Power Sources, vol. 243, Dec. 2013, pp. 508–18, https://doi.org/10.1016/j.jpowsour.2013.05.200.